DRK8090 Optical profiler
Lus piav qhia luv luv:
DuegothigheasurementRemisionPrasthree-ensetresearchtifemorallyTxoj kev, txuj ci tshawb fawb.Themaintechnical parameters.Unevensurfacemicrostructuredepthmeasurementrange.Thaum tsis muaj qhov chaw txuas ntxiv, muaj ntau tshaj li qhov ...
Vim yog qhov ntsuas siab precision, thiab nrog cov yam ntxwv peb-dimensional
Kev ntsuas tsis sib cuag, thiab kev siv lub tshuab computercontrolandrapidanalysis,
xam cov kev ntsuas ntsuas, qhov ntsuas tau tsim nyog rau txhua qib softest,
Measurement Chamberminingindustry, Precisionmachineshop,
butalsoforinstitutionsofhigherlearningandscientificresearchunits.
Themaintechnical parameters.
Unevensurfacemicrostructuredepthmeasurementrange.
Thaumona txuas ntxiv ntawm qhov chaw, muaj ntau dua li qhov siab mutant
1/4-wavelength ntawm qhov sib txuas ntawm ob sab: 1000-1nm
Adjacenthypermutation uas muaj ntau dua 1/4 wavelength nruab nrab ntawm wopixels:
130-1 nm
Measurementrepeatability:
