DRK8090 Optical profiler
Description:
Debita mensurae mensurae praecisionis, et cum charactere tria dimensiva non contingenti mensurae, et usus computatoris moderatio et rapidanalysis, mensurae mensurae effectus computant, instrumentum conveniens omnibus adaequatis, mensura inquisitionis unius mensurae mensurationis, mensurae mensurae, et usus computandi et rapidanalysis, mensurae mensurae effectus computant, instrumentum conveniens omnibus adaequatis, mensura inquisitionis unius mensurae mensurationis, mensurae mensurae, et usus computandi et RAPIDANALYSIS, mensurae mensurae effectus computant, instrumentum conveniens omnibus adaequatis, mensurae inquisitionis, una mensurae mensurationis, mensurae mensurae, et usus computandi et rabidanalysis, mensurae mensurae effectus computant, instrumentum conveniens omnibus adaequatis, mensurae inquisitionis, una mensurae mensurationis, mensurae mensurae, et usus computandi et rabidanalysis, mensurae mensurae effectus computant, instrumentum conveniens omnibus adaequatis, mensurae inquisitionis, una mensurae mensurationis, mensurae mensurae, et usus computandi et rapidanalysis, mensurae mensurae effectus computant;Themaintechnicalparameters.Unevensurfacemicrostructuredepthmeasurementrange.Cum continuus superficies non est maior quam heig...
Dueto the highmensurement precision, and with characteristic three-dimension
noncontactmensuratio;
calculate mensuras effectus, instrumentis opportunis pro omnibus commodis, etc.
measurementresearchunitofmeasurementchamberminingindustry,precisionmachineshop,
butalsoforinstitutions altioris eruditionis andscientificresearchunits.
Themaintechnicalparameters.
Unevensurfacemicrostructuredepthmeasurementrange.
Whenonacontinuoussurface, thereisnogreaterthantheheightmutant
1/4-wavelengthbetweenadjacenttwopixels:1000-1nm
Adjacenthypermutationcontaininggreaterthan1/4wavelengthbetweentwopixels:
130-1nm
Measurementrepeatability:
