DRK8090 Optical profiler
Incazelo emfushane:
Ngenxa yokunemba kwesilinganiso esiphezulu, kanye nesilinganiso sokungathintani esinezinhlangothi ezintathu, kanye nokusebenzisa ikhompuyutha ukulawula kanye ne-pidanalysis, ukubala imiphumela yokulinganisa, izinsimbi zifaneleka kulo lonke izinga elithambile kakhulu, ukulinganisa cwaninga izilinganiso zokukala imboni yezimboni, ukunemba kwesitolo somshini, ukunemba kwemishini .Amapharamitha weThemaintechnical.Unevensurfacemicrostructuredepthmeasurementrange.Lapho ubuso obuqhubekayo, bungaphezu kweheig...
Ngenxa yokunemba kwesilinganiso esiphezulu, kanye nesici esinezinhlangothi ezintathu
ukungathinteki, kanye nokusebenzisa ikhompyutha ukulawula kanye nokuhlaziya i-pidanalysis,
bala imiphumela yokulinganisa, izinsimbi zifaneleka kuwo wonke amazinga aphansi kakhulu,
ukulinganisa ukucwaninga okuphathelene nesilinganiso, imboni yokulinganisa, ukunemba komshini,
kodwa futhi nezikhungo zemfundo ephakeme kanye nezifundo zocwaningo lwesayensi.
Amapharamitha weThemaintechnical.
Unevensurfacemicrostructuredepthmeasurementrange.
Lapho ubuso obukhona obuqhubekayo, bungaphezu kobude obuguquguqukayo
1/4-ubude obuphakathi kwamaphikseli amabili aseduze: 1000-1nm
Ukuguqulwa kwe-hypermutation eseduze equkethe ubude begagasi obungaphezu kuka-1/4 phakathi kwamaphikseli amabili:
130-1nm
Ukukala ukuphindaphinda:
