DRK8090 Profiler ออปติคอล

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Duetothehighmeasurementprecision,andwithacharacteristicthree-dimensional noncontactmeasurement,andtheuseofcomputercontrolandrapidanalysis, calculatethemeasurementresults,theinstrumentissuitableforalllevelsoftest, measurementresearchunitofmeasurementchamberminingindustry,precisionmachineshop, butalsoforinstitutionsofhigherlearningandscientificresearchunits. Themaintechnicalparameters. Unevensurfacemicrostructuredepthmeasurementrange. Whenonacontinuoussurface,thereisnogreaterthantheheig...


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Duetothehighmeasurementprecision,andwithacharacteristicthree-dimensional

noncontactmeasurement,andtheuseofcomputercontrolandrapidanalysis,

calculatethemeasurementresults,theinstrumentissuitableforalllevelsoftest,

measurementresearchunitofmeasurementchamberminingindustry,precisionmachineshop,

butalsoforinstitutionsofhigherlearningandscientificresearchunits.

Themaintechnicalparameters.

Unevensurfacemicrostructuredepthmeasurementrange.

Whenonacontinuoussurface,thereisnogreaterthantheheightmutant

1/4-wavelengthbetweenadjacenttwopixels:1000-1nm

Adjacenthypermutationcontaininggreaterthan1/4wavelengthbetweentwopixels:

130-1nm

Measurementrepeatability:


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