DRK8090 Optical profiler
Short Description:
Duetothehighmeasurementprecision,andwithacharacteristicthree-dimensional noncontactmeasurement,andtheuseofcomputercontrolandrapidanalysis, calculatethemeasurementresults,theinstrumentissuitableforalllevelsoftest, measurementresearchunitofmeasurementchamberminingindustry,precisionmachineshop, butalsoforinstitutionsofhigherlearningandscientificresearchunits. Themaintechnicalparameters. Unevensurfacemicrostructuredepthmeasurementrange. Whenonacontinuoussurface,thereisnogreaterthantheheig...
Duetothehighmeasurementprecision,andwithacharacteristicthree-dimensional
noncontactmeasurement,andtheuseofcomputercontrolandrapidanalysis,
calculatethemeasurementresults,theinstrumentissuitableforalllevelsoftest,
measurementresearchunitofmeasurementchamberminingindustry,precisionmachineshop,
butalsoforinstitutionsofhigherlearningandscientificresearchunits.
Themaintechnicalparameters.
Unevensurfacemicrostructuredepthmeasurementrange.
Whenonacontinuoussurface,thereisnogreaterthantheheightmutant
1/4-wavelengthbetweenadjacenttwopixels:1000-1nm
Adjacenthypermutationcontaininggreaterthan1/4wavelengthbetweentwopixels:
130-1nm
Measurementrepeatability:
